dc.contributor.author | Simicic, Marko | |
dc.contributor.author | Morrison, Sebastien | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Sawada, Ken | |
dc.contributor.author | Ammo, Hiroaki | |
dc.contributor.author | Yamakawa, Shinya | |
dc.contributor.author | Nomoto, Kazuki | |
dc.contributor.author | Ono, Makoto | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Gielen, Georges | |
dc.date.accessioned | 2021-10-24T13:33:08Z | |
dc.date.available | 2021-10-24T13:33:08Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29437 | |
dc.source | IIOimport | |
dc.title | A fully-integrated method for RTN parameter extraction | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simicic, Marko | |
dc.contributor.imecauthor | Morrison, Sebastien | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Gielen, Georges | |
dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 132 | |
dc.source.endpage | 133 | |
dc.source.conference | Symposium on VLSI Technology | |
dc.source.conferencedate | 5/06/2017 | |
dc.source.conferencelocation | Kyoto Japan | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7998151/ | |
imec.availability | Published - imec | |