Publication:

Failure mode for p-GaN gates under forward gate stress with varying Mg concentration

Date

2017

Proceedings Paper

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Author(s)

Stoffels, Steve

;

Bakeroot, Benoit

;

;

;

Posthuma, Niels

;

Decoutere, Stefaan

;

Tallarico, A.N.

;

Metrics

1935 since deposited on 2021-10-24

Acq. date: 2026-01-07