Authors

Subhechha, Subhali; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Kinetic defect distribution approach for modeling the transient, endurance and retention of a-VMCO RRAM

Publication type

Proceedings paper

Embargo date

9999-12-31