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Solving the BEOL compatibility challenge of top-pinned magnetic tunnel junction stacks

dc.contributor.authorSwerts, Johan
dc.contributor.authorLiu, Enlong
dc.contributor.authorCouet, Sebastien
dc.contributor.authorMertens, Sofie
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorGarello, Kevin
dc.contributor.authorSouriau, Laurent
dc.contributor.authorKundu, Shreya
dc.contributor.authorCrotti, Davide
dc.contributor.authorYasin, Farrukh
dc.contributor.authorJossart, Nico
dc.contributor.authorSakhare, Sushil
dc.contributor.authorDevolder, Thibaut
dc.contributor.authorVan Beek, Simon
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-24T14:33:25Z
dc.date.available2021-10-24T14:33:25Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29533
dc.sourceIIOimport
dc.titleSolving the BEOL compatibility challenge of top-pinned magnetic tunnel junction stacks
dc.typeProceedings paper
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorGarello, Kevin
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorJossart, Nico
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage856
dc.source.endpage859
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate2/12/2017
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8268518/
imec.availabilityPublished - open access


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