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Dummy gate amorphous silicon CMP using in-situ profile CLC endpoint system for advanced FinFET
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Dummy gate amorphous silicon CMP using in-situ profile CLC endpoint system for advanced FinFET
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tsvetanova, Diana
;
Iizumi, Takeshi
;
Ito, Ban
;
Royere, Gael
;
Durix, Fabien
;
Devriendt, Katia
;
Ong, Patrick
;
Struyf, Herbert
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2098
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Acq. date: 2025-12-18
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Metrics
Views
2098
since deposited on 2021-10-24
2
last month
Acq. date: 2025-12-18
Citations