dc.contributor.author | Varela Pedreira, Olalla | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Lesniewska, Alicja | |
dc.contributor.author | Wu, Chen | |
dc.contributor.author | van der Veen, Marleen | |
dc.contributor.author | De Messemaeker, Joke | |
dc.contributor.author | Vandersmissen, Kevin | |
dc.contributor.author | Jourdan, Nicolas | |
dc.contributor.author | Wen, Liang Gong | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Briggs, Basoene | |
dc.contributor.author | Vega Gonzalez, Victor | |
dc.contributor.author | Boemmels, Juergen | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-24T17:20:21Z | |
dc.date.available | 2021-10-24T17:20:21Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29795 | |
dc.source | IIOimport | |
dc.title | Reliability study on cobalt and ruthenium as alternative metals for advance interconnects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Varela Pedreira, Olalla | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Lesniewska, Alicja | |
dc.contributor.imecauthor | Wu, Chen | |
dc.contributor.imecauthor | van der Veen, Marleen | |
dc.contributor.imecauthor | De Messemaeker, Joke | |
dc.contributor.imecauthor | Vandersmissen, Kevin | |
dc.contributor.imecauthor | Jourdan, Nicolas | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Briggs, Basoene | |
dc.contributor.imecauthor | Vega Gonzalez, Victor | |
dc.contributor.imecauthor | Boemmels, Juergen | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Lesniewska, Alicja::0000-0003-3863-065X | |
dc.contributor.orcidimec | Wu, Chen::0000-0002-4636-8842 | |
dc.contributor.orcidimec | van der Veen, Marleen::0000-0002-9402-8922 | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6B-2.1 | |
dc.source.endpage | 6B-2.8 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 2/04/2017 | |
dc.source.conferencelocation | Monterey, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7936340/ | |
imec.availability | Published - open access | |