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Inherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics

dc.contributor.authorVerhulst, Anne
dc.contributor.authorVerreck, Devin
dc.contributor.authorVandenberghe, William
dc.contributor.authorSmets, Quentin
dc.contributor.authorMohammed, Mazharuddin
dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorHeyns, Marc
dc.contributor.authorSoree, Bart
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-24T17:51:56Z
dc.date.available2021-10-24T17:51:56Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29840
dc.sourceIIOimport
dc.titleInherent transmission probability limit between valence-band and conduction band states and calibration of tunnel-FET parasitics
dc.typeProceedings paper
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conference5th Berkeley Symposium on Energy-Effiicient Electronic Systems and Steep Transistors Workshop
dc.source.conferencedate19/10/2017
dc.source.conferencelocationBerkeley, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8246193
imec.availabilityPublished - open access


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