Publication:

Superior NBTI in high-k SiGe transistors - Part I: experimental

Date

2017

Journal article

Simple item page Full metadata Statistics

Files

34278.pdf 1.45 MB

Author(s)

;

;

;

;

;

;

Witters, Liesbeth

;

;

Horiguchi, Naoto

;

Journal

IEEE Transactions on Electron Devices

Metrics

1903 since deposited on 2021-10-24

Acq. date: 2026-01-11