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Defect-based compact modeling for RTN and BTI variability

dc.contributor.authorWeckx, Pieter
dc.contributor.authorSimicic, Marko
dc.contributor.authorNomoto, Kazuki
dc.contributor.authorOno, Makoto
dc.contributor.authorParvais, Bertrand
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorLinten, Dimitri
dc.contributor.authorSawada, Ken
dc.contributor.authorAmmo, Hiroaki
dc.contributor.authorYamakawa, Shinya
dc.contributor.authorSpessot, Alessio
dc.contributor.authorVerkest, Diederik
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-24T18:45:52Z
dc.date.available2021-10-24T18:45:52Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29918
dc.sourceIIOimport
dc.titleDefect-based compact modeling for RTN and BTI variability
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageCR-7.1
dc.source.endpageCR-7.6
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936356/
imec.availabilityPublished - open access


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