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Probing the indium mole fraction in an InGaN epilayer by depth resolved catholuminescence
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Authors
Trager-Cowan, C.
;
Middleton, P. G.
;
Mohammed, A.
;
O'Donnell, K. P. O.
;
Van der Stricht, Wim
;
Moerman, Ingrid
;
Demeester, Piet
Conference
Nitride Semiconductors
Title
Probing the indium mole fraction in an InGaN epilayer by depth resolved catholuminescence
Publication type
Proceedings paper
Embargo date
9999-12-31
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