dc.contributor.author | Akanishi, Yuya | |
dc.contributor.author | Kesters, Els | |
dc.contributor.author | Le, Quoc Toan | |
dc.contributor.author | Holsteyns, Frank | |
dc.date.accessioned | 2021-10-25T16:31:29Z | |
dc.date.available | 2021-10-25T16:31:29Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30091 | |
dc.source | IIOimport | |
dc.title | Corrosion of Co in BEOL interconnects in dilute HF solution | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Akanishi, Yuya | |
dc.contributor.imecauthor | Kesters, Els | |
dc.contributor.imecauthor | Le, Quoc Toan | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 256 | |
dc.source.endpage | 262 | |
dc.source.conference | Ultra Clean Processing of Semiconductor Surfaces XIV - UCPSS | |
dc.source.conferencedate | 2/09/2018 | |
dc.source.conferencelocation | Leuven Belgium | |
dc.identifier.url | https://www.scientific.net/SSP.282.256 | |
imec.availability | Published - imec | |
imec.internalnotes | Solid State Phenomena; Vol. 282 | |