Publication:
Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures
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1970 since deposited on 2021-10-25
1last month
Acq. date: 2026-04-06
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1970 since deposited on 2021-10-25
1last month
Acq. date: 2026-04-06
Citations