Publication:
Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures
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1971 since deposited on 2021-10-25
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Acq. date: 2026-08-07
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1971 since deposited on 2021-10-25
1last month
1last week
Acq. date: 2026-08-07
Citations