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A method to pattern tight tip-to-tip in 32nm-pitch N5 interconnect using Ru area selective deposition tone inversion process
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A method to pattern tight tip-to-tip in 32nm-pitch N5 interconnect using Ru area selective deposition tone inversion process
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Briggs, Basoene
;
Soethoudt, Job
;
Delabie, Annelies
;
Wilson, Chris
;
Tokei, Zsolt
;
Boemmels, Juergen
;
Devriendt, Katia
;
Sebaai, Farid
;
Lorant, Christophe
;
Hody, Hubert
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2058
since deposited on 2021-10-25
Acq. date: 2026-01-07
Citations
Metrics
Views
2058
since deposited on 2021-10-25
Acq. date: 2026-01-07
Citations