Publication:

A method to pattern tight tip-to-tip in 32nm-pitch N5 interconnect using Ru area selective deposition tone inversion process

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2071 since deposited on 2021-10-25
Acq. date: 2026-09-16

Citations

Statistics

Views

2071 since deposited on 2021-10-25
Acq. date: 2026-09-16

Citations