Self-heating-aware CMOS reliability characterization using degradation maps

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Authors
Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Simicic, Marko; Weckx, Pieter; Linten, Dimitri
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Self-heating-aware CMOS reliability characterization using degradation maps
Publication type
Proceedings paper
Embargo date
9999-12-31
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