dc.contributor.author | Bury, Erik | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Chuang, Kent | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Simicic, Marko | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Linten, Dimitri | |
dc.date.accessioned | 2021-10-25T16:59:33Z | |
dc.date.available | 2021-10-25T16:59:33Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30343 | |
dc.source | IIOimport | |
dc.title | Self-heating-aware CMOS reliability characterization using degradation maps | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Chuang, Kent | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Simicic, Marko | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2A.3-1 | |
dc.source.endpage | 2A.3-6 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 11/03/2018 | |
dc.source.conferencelocation | San Francisco, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8353541/ | |
imec.availability | Published - open access | |