Recent insights in CMOS reliability characterization by the use of degradation maps

Thumbnail
View/open
Metadata
Show full item record
Authors
Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Simicic, Marko; Weckx, Pieter; Linten, Dimitri
Conference
14th International Conference on Solid-State and Integrated Circuit Technology - ICSICT
Title
Recent insights in CMOS reliability characterization by the use of degradation maps
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections