A multi-bits/cell PUF using analog breakdown positions in CMOS

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Authors
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Kallstenius, Thomas; Groeseneken, Guido; Linten, Dimitri; Verbauwhede, Ingrid
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
A multi-bits/cell PUF using analog breakdown positions in CMOS
Publication type
Proceedings paper
Embargo date
9999-12-31
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