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Are extended defects a show stopper for future III-V CMOS technologies?
Publication:
Are extended defects a show stopper for future III-V CMOS technologies?
Date
2018-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Hsu, Brent
;
He, Liang
;
Mols, Yves
;
Kunert, Bernardette
;
Langer, Robert
;
Waldron, Niamh
;
Eneman, Geert
;
Collaert, Nadine
;
Heyns, Marc
;
Simoen, Eddy
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1926
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Acq. date: 2025-10-31
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Views
1926
since deposited on 2021-10-25
1
last week
Acq. date: 2025-10-31
Citations