dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Cherman, Vladimir | |
dc.contributor.author | Lofrano, Melina | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Kljucar, Luka | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-25T17:29:29Z | |
dc.date.available | 2021-10-25T17:29:29Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30475 | |
dc.source | IIOimport | |
dc.title | Stress mitigation of 3D-stacking/packaging induced stresses | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Cherman, Vladimir | |
dc.contributor.imecauthor | Lofrano, Melina | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Kljucar, Luka | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 11/03/2018 | |
dc.source.conferencelocation | Burlingame, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8353590/ | |
imec.availability | Published - open access | |