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Determining Si composition in SiGe alloys with <1% Si concentrations using Raman spectroscopy

dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorSimons, Veerle
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorVerheyen, Peter
dc.contributor.authorLoo, Roger
dc.date.accessioned2021-10-25T17:53:46Z
dc.date.available2021-10-25T17:53:46Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30567
dc.sourceIIOimport
dc.titleDetermining Si composition in SiGe alloys with <1% Si concentrations using Raman spectroscopy
dc.typeMeeting abstract
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewyes
dc.source.beginpage1070
dc.source.conference2018 AiMES ECS International Meeting
dc.source.conferencedate30/09/2018
dc.source.conferencelocationCancun Mexico
dc.identifier.urlhttp://ma.ecsdl.org/content/MA2018-02/31/1070.short
imec.availabilityPublished - imec
imec.internalnotesElectrochemical Society Meeting Abstracts; Vol. MA2018-02


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