Multi-beam microscopy free of sample-induced phase distortions

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Authors
Diaz Tormo, Alejandro; Khalenkow, Dmitry; Skirtach, Abdre G.; Le Thomas, Nicolas
Conference
23rd Annual Symposium of the IEEE Photonics Benelux Chapter
Title
Multi-beam microscopy free of sample-induced phase distortions
Publication type
Proceedings paper
Embargo date
9999-12-31
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