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Conference contributions
Multi-beam microscopy free of sample-induced phase distortions
Publication:
Multi-beam microscopy free of sample-induced phase distortions
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Date
2018
Proceedings Paper
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41001.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Diaz Tormo, Alejandro
;
Khalenkow, Dmitry
;
Skirtach, Abdre G.
;
Le Thomas, Nicolas
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Abstract
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1921
since deposited on 2021-10-25
Acq. date: 2026-01-09
Citations
Metrics
Views
1921
since deposited on 2021-10-25
Acq. date: 2026-01-09
Citations