Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications
Publication:
Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
38619.pdf
2.08 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Doevenspeck, Jonas
;
Degraeve, Robin
;
Cosemans, Stefan
;
Roussel, Philippe
;
Verhoef, Bram
;
Lauwereins, Rudy
;
Dehaene, Wim
Journal
Abstract
Description
Metrics
Views
1916
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations
Metrics
Views
1916
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations