Authors

Doevenspeck, Jonas; Degraeve, Robin; Cosemans, Stefan; Roussel, Philippe; Verhoef, Bram; Lauwereins, Rudy; Dehaene, Wim

Conference

48th European Solid-State Device Research Conference - ESSDERC

Title

Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications

Publication type

Proceedings paper

Embargo date

9999-12-31