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Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection

dc.contributor.authorFatermans, J.
dc.contributor.authorden Dekker, Arnold Jan
dc.contributor.authorMüller-Caspary, K.
dc.contributor.authorLobato, I.
dc.contributor.authorVan Aert, S.
dc.date.accessioned2021-10-25T18:34:07Z
dc.date.available2021-10-25T18:34:07Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30693
dc.sourceIIOimport
dc.titleBayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
dc.typeMeeting abstract
dc.source.peerreviewyes
dc.source.beginpageG-O4
dc.source.conference69th Annual Meeting of the Nordic Microscopy Society - SCANDEM
dc.source.conferencedate25/06/2018
dc.source.conferencelocationLyngby Denmark
dc.identifier.urlhttps://issuu.com/dtudanchipcen/docs/scandem_book_of_abstracts_25_june_2
imec.availabilityPublished - imec


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