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The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images

dc.contributor.authorFatermans, J.
dc.contributor.authorden dekker, Arnold Jan
dc.contributor.authorMüller-Caspary, K.
dc.contributor.authorLobato, I.
dc.contributor.authorVan Aert, Sandra
dc.date.accessioned2021-10-25T18:34:25Z
dc.date.available2021-10-25T18:34:25Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30694
dc.sourceIIOimport
dc.titleThe maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
dc.typeMeeting abstract
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference19th International Microscopy Congress - IMC19
dc.source.conferencedate9/09/2018
dc.source.conferencelocationSydney Australi�
imec.availabilityPublished - open access


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