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Investigation of the endurance of FE-HfO2 devices by means of TDDB studies

dc.contributor.authorFlorent, Karine
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorLavizzari, Simone
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCelano, Umberto
dc.contributor.authorKaczer, Ben
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-25T18:41:33Z
dc.date.available2021-10-25T18:41:33Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30714
dc.sourceIIOimport
dc.titleInvestigation of the endurance of FE-HfO2 devices by means of TDDB studies
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage6D.3-1
dc.source.endpage6D.3-7
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/abstract/document/8353634/
imec.availabilityPublished - imec


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