Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

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Authors
Fodor, Ferenc; Marinissen, Erik Jan; Acconcia, Daniele; Vallauri, Raffaele
Conference
Semiconductor Wafer Test Workshop - SWTW
Title
Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution
Publication type
Proceedings paper
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