dc.contributor.author | Fodor, Ferenc | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Acconcia, Daniele | |
dc.contributor.author | Vallauri, Raffaele | |
dc.date.accessioned | 2021-10-25T18:42:12Z | |
dc.date.available | 2021-10-25T18:42:12Z | |
dc.date.issued | 2018-06 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30716 | |
dc.source | IIOimport | |
dc.title | Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Fodor, Ferenc | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.source.peerreview | yes | |
dc.source.conference | Semiconductor Wafer Test Workshop - SWTW | |
dc.source.conferencedate | 3/06/2018 | |
dc.source.conferencelocation | San Diego, CA USA | |
dc.identifier.url | http://www.swtest.org/swtw_library/2018proc/PDF/S02_03_Fodor_SWTW2018.pdf | |
imec.availability | Published - imec | |