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On the impact of the gate metal work-function on the charge trapping component of BTI
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Authors
Franco, Jacopo
;
Wu, Zhicheng
;
Rzepa, Gerhard
;
Ragnarsson, Lars-Ake
;
Dekkers, Harold
;
Vandooren, Anne
;
Groeseneken, Guido
;
Horiguchi, Naoto
;
Collaert, Nadine
;
Linten, Dimitri
;
Grasser, Tibor
;
Kaczer, Ben
Conference
International Integrated Reliability Workshop - IIRW 2018
Title
On the impact of the gate metal work-function on the charge trapping component of BTI
Publication type
Proceedings paper
Embargo date
9999-12-31
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