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Challenges for I/O towards the 3-nm node: Si/SiGe superlatttice I/O finFET in a horizontal nanowire technology and the increased ausceptibility of bulk finFET technology to single event latchup

dc.contributor.authorHellings, Geert
dc.contributor.authorMertens, Hans
dc.contributor.authorKarp, James
dc.contributor.authorMaillard, Pierre
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorSimoen, Eddy
dc.contributor.authorSchram, Tom
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorSimicic, Marko
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorParvais, Bertrand
dc.contributor.authorBoudier, D
dc.contributor.authorCretu, B
dc.contributor.authorMachillot, J
dc.contributor.authorPena, V
dc.contributor.authorSun, S
dc.contributor.authorYoshida, N
dc.contributor.authorKim, N
dc.contributor.authorMocuta, Anda
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHart, Michael
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-25T19:41:03Z
dc.date.available2021-10-25T19:41:03Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30870
dc.sourceIIOimport
dc.titleChallenges for I/O towards the 3-nm node: Si/SiGe superlatttice I/O finFET in a horizontal nanowire technology and the increased ausceptibility of bulk finFET technology to single event latchup
dc.typeProceedings paper
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.conferenceTaiwan ESD and Reliability Conference
dc.source.conferencedate7/09/2018
dc.source.conferencelocationHsinchu Taiwan
dc.identifier.urlhttp://www.alab.ee.nctu.edu.tw/~esd/TESDC/program.html
imec.availabilityPublished - imec


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