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Characterization by GISAXS and electrochemical impedance spectroscopy of porous oxide films

dc.contributor.authorHuanca, Danilo
dc.contributor.authorVerdonck, Patrick
dc.contributor.authorDias, Carlos
dc.contributor.authorPetersen Barbosa Lima, Lucas
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authordos Santos, Sebastiao
dc.contributor.authorWitters, Thomas
dc.date.accessioned2021-10-25T19:59:11Z
dc.date.available2021-10-25T19:59:11Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30913
dc.sourceIIOimport
dc.titleCharacterization by GISAXS and electrochemical impedance spectroscopy of porous oxide films
dc.typeProceedings paper
dc.contributor.imecauthorVerdonck, Patrick
dc.contributor.imecauthorPetersen Barbosa Lima, Lucas
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorWitters, Thomas
dc.contributor.orcidimecVerdonck, Patrick::0000-0003-2454-0602
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference33rd Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate27/08/2018
dc.source.conferencelocationBento Goncalves Brazil
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8511356
imec.availabilityPublished - open access


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