dc.contributor.author | Inoue, Fumihiro | |
dc.contributor.author | Derakhshandeh, Jaber | |
dc.contributor.author | Moeller, Berthold | |
dc.contributor.author | Gokita, Yohei | |
dc.contributor.author | Duval, Fabrice | |
dc.contributor.author | Bex, Pieter | |
dc.contributor.author | Capuz, Giovanni | |
dc.contributor.author | Rebibis, Kenneth June | |
dc.contributor.author | Miller, Andy | |
dc.contributor.author | Sleeckx, Erik | |
dc.contributor.author | Beyer, Gerald | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-25T20:09:41Z | |
dc.date.available | 2021-10-25T20:09:41Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30937 | |
dc.source | IIOimport | |
dc.title | Polymer and bump planarization for fine pitch micro-bump stacking | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Inoue, Fumihiro | |
dc.contributor.imecauthor | Derakhshandeh, Jaber | |
dc.contributor.imecauthor | Duval, Fabrice | |
dc.contributor.imecauthor | Bex, Pieter | |
dc.contributor.imecauthor | Capuz, Giovanni | |
dc.contributor.imecauthor | Rebibis, Kenneth June | |
dc.contributor.imecauthor | Miller, Andy | |
dc.contributor.imecauthor | Sleeckx, Erik | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Derakhshandeh, Jaber::0000-0003-2448-9165 | |
dc.contributor.orcidimec | Bex, Pieter::0000-0003-0896-2514 | |
dc.contributor.orcidimec | Capuz, Giovanni::0000-0002-5263-4836 | |
dc.contributor.orcidimec | Sleeckx, Erik::0000-0003-2560-6132 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1135 | |
dc.source.conference | AiMES2018 Meeting G05-Materials, Formulation, and Processes for Semiconductor, 2.5 and 3D Chip Packaging, and High Density ... | |
dc.source.conferencedate | 30/09/2018 | |
dc.source.conferencelocation | Cancun Mexico | |
dc.identifier.url | http://ma.ecsdl.org/content/MA2018-02/33/1135.abstract | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Meeting Abstracts; Vol. MA2018-02 | |