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On-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs

dc.contributor.authorKatselas, Leonidas
dc.contributor.authorHatzopoulos, Alkis
dc.contributor.authorJiao, Hailong
dc.contributor.authorPapameletis, Christos
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-25T20:47:38Z
dc.date.available2021-10-25T20:47:38Z
dc.date.issued2018-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31023
dc.sourceIIOimport
dc.titleOn-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs
dc.typeProceedings paper
dc.contributor.imecauthorKatselas, Leonidas
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage9
dc.source.conferenceIEEE International Test Conference - ITC'18
dc.source.conferencedate28/10/2018
dc.source.conferencelocationPhoenix, AZ USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8624803
imec.availabilityPublished - open access


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