dc.contributor.author | Loo, Roger | |
dc.contributor.author | Shimura, Yosuke | |
dc.contributor.author | Ike, Shinichi | |
dc.contributor.author | Vohra, Anurag | |
dc.contributor.author | Stoica, Toma | |
dc.contributor.author | Buca, Dan | |
dc.contributor.author | Kohen, David | |
dc.contributor.author | Margetis, Joe | |
dc.contributor.author | Tolle, John | |
dc.date.accessioned | 2021-10-25T22:29:44Z | |
dc.date.available | 2021-10-25T22:29:44Z | |
dc.date.issued | 2018-05 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31233 | |
dc.source | IIOimport | |
dc.title | Epitaxial GeSn: impact of process conditions on material quality | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Vohra, Anurag | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Vohra, Anurag::0000-0002-2831-0719 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 195 | |
dc.source.endpage | 196 | |
dc.source.conference | Joint ISTDM/ICSI Conference | |
dc.source.conferencedate | 27/05/2018 | |
dc.source.conferencelocation | Frankfurt (Oder) Germany | |
imec.availability | Published - imec | |