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Effects of grain boundaries on the electronic properties of MoS2 layers

dc.contributor.authorLudwig, Jonathan
dc.contributor.authorChiappe, Daniele
dc.contributor.authorMascaro, Marco
dc.contributor.authorCelano, Umberto
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorRadu, Iuliana
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorParedis, Kristof
dc.date.accessioned2021-10-25T22:36:15Z
dc.date.available2021-10-25T22:36:15Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31245
dc.sourceIIOimport
dc.titleEffects of grain boundaries on the electronic properties of MoS2 layers
dc.typeMeeting abstract
dc.contributor.imecauthorLudwig, Jonathan
dc.contributor.imecauthorMascaro, Marco
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorParedis, Kristof
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewno
dc.source.beginpageK.VII.1
dc.source.conferenceE-MRS Spring Meeting Symposium K: Defect-induced Effects in Nanomaterials
dc.source.conferencedate18/06/2018
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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