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Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution
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Authors
Ma, Jigang
;
Chai, Zheng
;
Zhang, Wei Dong
;
Zhang, J. F.
;
Ji, Z.
;
Benbakhti, Brahim
;
Govoreanu, Bogdan
;
Simoen, Eddy
;
Goux, Ludovic
;
Belmonte, Attilio
;
Degraeve, Robin
;
Kar, Gouri Sankar
;
Jurczak, Gosia
ISSN
0018-9383
Issue
3
Journal
IEEE Transactions on Electron Devices
Volume
65
Title
Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution
Publication type
Journal article
Embargo date
9999-12-31
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