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Articles
Wet-chemical etching of atom probe tips for artefact free analyses of nanoscaled semiconductor structures
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Wet-chemical etching of atom probe tips for artefact free analyses of nanoscaled semiconductor structures
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Melkonyan, Davit
;
Fleischmann, Claudia
;
Veloso, Anabela
;
Franquet, Alexis
;
Bogdanowicz, Janusz
;
Morris, Richard
;
Vandervorst, Wilfried
Journal
Ultramicroscopy
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1879
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Views
1879
since deposited on 2021-10-25
1
last month
1
last week
Acq. date: 2026-04-26
Citations