Power GaN HEMT degradation: from time-dependent breakdown to hot-electron effects

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Author(s)

Meneghini, Matteo

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De Santi, Carlos

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Stoffels, Steve

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Posthuma, Niels

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Decoutere, Stefaan

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Haeberlen, Oliver

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Meneghesso, Gaudenzio

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Metrics

1955 since deposited on 2021-10-25

Acq. date: 2025-10-27