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Precise measurement of thin-film thickness in 3D-NAND device with CD-SEM
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Precise measurement of thin-film thickness in 3D-NAND device with CD-SEM
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohashi, Takeyoshi
;
Yamaguchi, Atsuko
;
Hasumi, Kazuhisa
;
Ikota, Masami
;
Lorusso, Gian
;
Tan, Chi Lim
;
Van den Bosch, Geert
;
Furnemont, Arnaud
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
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1938
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Acq. date: 2025-12-10
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Metrics
Views
1938
since deposited on 2021-10-26
2
last month
1
last week
Acq. date: 2025-12-10
Citations