Publication:

Relaxing the STT-MRAM reliability challenge by scaling MgO thickness

Date

2018

Presentation

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Author(s)

O'Sullivan, Barry

;

Van Beek, Simon

;

Roussel, Philippe

;

;

;

Couet, Sebastien

;

;

;

;

Linten, Dimitri

;

Kar, Gouri Sankar

Statistics

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Acq. date: 2026-01-14