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Relaxing the STT-MRAM reliability challenge by scaling MgO thickness

dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorVan Beek, Simon
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRao, Siddharth
dc.contributor.authorKim, Woojin
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSwerts, Johan
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCrotti, Davide
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-26T00:33:13Z
dc.date.available2021-10-26T00:33:13Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31461
dc.sourceIIOimport
dc.titleRelaxing the STT-MRAM reliability challenge by scaling MgO thickness
dc.typeOral presentation
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewno
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate13/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.identifier.urlhttps://irps.org/2018/program/poster-session-reception/
imec.availabilityPublished - imec


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