dc.contributor.author | Pacco, Antoine | |
dc.contributor.author | Holsteyns, Frank | |
dc.contributor.author | Schaekers, Marc | |
dc.contributor.author | Everaert, Jean-Luc | |
dc.contributor.author | Dictus, Dries | |
dc.contributor.author | Cuypers, Daniel | |
dc.date.accessioned | 2021-10-26T00:37:16Z | |
dc.date.available | 2021-10-26T00:37:16Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31468 | |
dc.source | IIOimport | |
dc.title | Selective wet removal of the SiN contact etch stop layer prior to S/D contact formation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pacco, Antoine | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.imecauthor | Schaekers, Marc | |
dc.contributor.imecauthor | Everaert, Jean-Luc | |
dc.contributor.imecauthor | Dictus, Dries | |
dc.contributor.orcidimec | Schaekers, Marc::0000-0002-1496-7816 | |
dc.contributor.orcidimec | Dictus, Dries::0000-0002-7896-1747 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | The Surface Preparation and Cleaning Conference - SPCC | |
dc.source.conferencedate | 9/04/2018 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - open access | |