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Effect of annealing ferroelectric HfO2 thin films: In situ, high temperature X-ray diffraction
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1924 since deposited on 2021-10-26
1last week
Acq. date: 2025-10-28
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Views
1924 since deposited on 2021-10-26
1last week
Acq. date: 2025-10-28
Citations