Show simple item record

Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps

dc.contributor.authorPutcha, Vamsi
dc.contributor.authorFranco, Jacopo
dc.contributor.authorVais, Abhitosh
dc.contributor.authorSioncke, Sonja
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-26T01:38:43Z
dc.date.available2021-10-26T01:38:43Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31571
dc.sourceIIOimport
dc.titleImpact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps
dc.typeMeeting abstract
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage5A.3-1
dc.source.endpage5A.3-7
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353603/
imec.availabilityPublished - imec


Files in this item

Thumbnail
Name:
37170.pdf
Size:
928.1Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record