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Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps
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Authors
Putcha, Vamsi
;
Franco, Jacopo
;
Vais, Abhitosh
;
Sioncke, Sonja
;
Kaczer, Ben
;
Linten, Dimitri
;
Groeseneken, Guido
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps
Publication type
Meeting abstract
Embargo date
9999-12-31
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