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Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps
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Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps
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Date
2018
Meeting abstract
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37170.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Putcha, Vamsi
;
Franco, Jacopo
;
Vais, Abhitosh
;
Sioncke, Sonja
;
Kaczer, Ben
;
Linten, Dimitri
;
Groeseneken, Guido
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1864
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1864
since deposited on 2021-10-26
3
last month
Acq. date: 2025-12-15
Citations