Authors

Witvrouw, Ann; Maex, Karen; De Ceuninck, Ward; Lekens, Geert; D'Haen, Jan; De Schepper, Luc

Conference

Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF

Title

The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements

Publication type

Proceedings paper

Embargo date

9999-12-31