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Formation and thermal stability of Nd0.32Y0.68Si1.7 layers formed by channeled ion beam synthesis
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Authors
Wu, Ming Fang
;
Vantomme, Andre
;
Hogg, S.
;
Pattyn, H.
;
Langouche, G.
;
Jin, S.
;
Bender, Hugo
Conference
Advanced Interconnects and Contact Materials and Processes for Future Integrated Circuits
Title
Formation and thermal stability of Nd0.32Y0.68Si1.7 layers formed by channeled ion beam synthesis
Publication type
Proceedings paper
Embargo date
9999-12-31
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