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Quantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications
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Authors
Rao, Siddharth
;
Perumkunnil, Manu
;
Kundu, Shreya
;
Souriau, Laurent
;
Swerts, Johan
;
Couet, Sebastien
;
Yasin, Farrukh
;
Kim, Woojin
;
Tsvetanova, Diana
;
Jossart, Nico
;
Crotti, Davide
;
Furnemont, Arnaud
;
Kar, Gouri Sankar
Conference
International Conference on Magnetism - ICM
Title
Quantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications
Publication type
Proceedings paper
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