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Quantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications

dc.contributor.authorRao, Siddharth
dc.contributor.authorPerumkunnil, Manu
dc.contributor.authorKundu, Shreya
dc.contributor.authorSouriau, Laurent
dc.contributor.authorSwerts, Johan
dc.contributor.authorCouet, Sebastien
dc.contributor.authorYasin, Farrukh
dc.contributor.authorKim, Woojin
dc.contributor.authorTsvetanova, Diana
dc.contributor.authorJossart, Nico
dc.contributor.authorCrotti, Davide
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-26T02:13:10Z
dc.date.available2021-10-26T02:13:10Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31627
dc.sourceIIOimport
dc.titleQuantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications
dc.typeProceedings paper
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorPerumkunnil, Manu
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorTsvetanova, Diana
dc.contributor.imecauthorJossart, Nico
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecTsvetanova, Diana::0000-0002-5632-5539
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.source.peerreviewyes
dc.source.beginpageV3-04
dc.source.conferenceInternational Conference on Magnetism - ICM
dc.source.conferencedate15/07/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttp://www.icm2018sf.org/doc/ICM18_Abs_Indx_FINAL_1.pdf
imec.availabilityPublished - imec


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