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CD control using SiON BARL processing for sub 0.25µm lithography
Publication:
CD control using SiON BARL processing for sub 0.25µm lithography
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Fenghong
;
Op de Beeck, Maaike
;
Ronse, Kurt
;
Gangala, Hareen K
;
Gopalan, P.
;
Conley, P.
;
Dusa, M.
;
Bendik, Joe
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1967
since deposited on 2021-10-01
2
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1967
since deposited on 2021-10-01
2
last month
Acq. date: 2025-12-10
Citations